Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization, 5)
4.5 (1,234)
Sold 100+ last 30 days
20% off first order
$189.99$207.88
9% off
Color
Black
Quantity
Product description loading
Product description loading
This is the product description text that will appear here.
Quantity
1
Description
ISBN: 0306458969 Author: Czanderna, Alvin W. Condition: New Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how...